Search for:
language
English
한국어
日本語
简体中文
繁體中文
Sign in
Newsletter
Contact
LayTec
> Company
Home
Solutions
Industries
Optoelectronics
VCSEL
UV LEDs
Quantum cascade lasers (QCL)
Electronics
Power and RF Electronics
Photovoltaics
c-Si
c-Si back end
CIGS
CdTe
CPV
Perovskites
Displays
Others
Processes
Epitaxy
IR pyrometry
3 wavelength reflectance
In-situ wafer bow
UV pyrometry
Reflectance Anisotropy Spectroscopy
ALD
Sputter deposition
Roll-to-roll
CBD
Dry Etch
Materials
III-Nitride based
III-Nitride growth on silicon (Gan/Si)
InP based
GaAs based
PSS
Solar Cell Materials
Advanced R&D
Products
In-situ Metrology
EpiTT
EpiCurve® TT
Spectral Systems
Pyro 400
TRIton
AbsoluT
InspiRe
EpiRAS
In-line Metrology
ILMetro
X Link
PearL & t-PearL
EddyCus
Flames
At-line Metrology
EpiX
X Link off-line
Software Solutions
OEM Solutions
Key Technologies
Metrology Methods
3λ reflectance
Spectroscopic R&T
IR Pyrometry
UV Pyrometry
Deflectometry/Curvature measurement
Photoluminescence
Conductivity
Reflectance Anisotropy Spectroscopy (RAS)
Advanced Process Control
Fault detection
Run-to-run control
Real time feedback control
Connected Metrology
Support
My Account
Support Request
Service Partners
Service Portfolio
News/Events
News
Press Releases
Events
Seminars
Newsletter Library
Company
Who we are
ESG-Sustainability
Supervisory board
How to find us
Nynomic AG
Global sales network
Career
Quality commitment
Funded projects
Company
Company news
LayTec joins Nynomic Group
LayTec’s 2000
th
in-situ tool delivered to Compound Semiconductor Centre
LayTec welcomes new members in sales and customer support teams
