In-situ seminar in conjunction with ICNS 15

Dear LayTec customers & all interested in in-situ monitoring,

Registration to our in-situ seminar in conjunction with the ICNS 15 conference is open now! Come join us in Malmö to share ideas and experiences, and to discover the latest news at LayTec.

You can register via Eventbrite here

Date: July 7, 2025
Time: after the last session (approx. 7PM) until 10PM
Venue: Clarion Hotel & Congress Malmö Live, Malmö, Sweden

This year's speakers & topics :

• Peter Parbrook (University College Cork): Using in-situ monitoring in structured epitaxial growth
• Nicolas Delpuech (III-V Lab, a joint lab of Nokia, Thales, CEA Leti): Advantages of using TRIton during plasma etching process
• Menno Kappers (University of Cambridge): Strain management of GaN-on-Si heterostructures
• Johannes Zettler (LayTec): The benefits of high performance wafer mapping and connected metrology
• Kolja Haberland (LayTec): Latest developments at LayTec

We anticipate lively individual discussions. Guests are also invited to enjoy food and drinks.

There will be limited seating capacity for this event, with attendance on a first come, first served basis. The registration is free of charge.

Kindly complete your online registration before June 30, 2025. All participants will automatically receive a PDF version of the presentations after the event. If you are unable to participate, select "Can't attend? Download the presentations!" to be able to access the presentation slides from our website after the event.

Please feel free to pass this invitation on to your colleagues!

We are looking forward to meeting you in Malmö!

Best regards
Your LayTec Team

LayTec AG  |  Seesener Str. 10-13  |  10709 Berlin, Germany  |  Tel.: +49 (0)30 89 00 55-0   |  Fax: +49 (0)30 89 00 55-180  |  Email: info@laytec.de | LinkedIn