OEM solutions: Integrated in-situ intelligence

As a supplier of non-destructive metrology tools, LayTec closely cooperates with manufacturers of thin-film systems to develop the best possible solutions for their process monitoring and control. Our OEM components are created and tested according to the manufacturers’ specifications and standards. This guarantees:

  • Optimal performance according to factory specs
  • Full integration and compatibility with the equipment
  • Quick replacement or upgrade of the parts
  • Fast and extensive technical support.

Here are some examples of our OEM solutions:

LayTec‘s XBow is a metrology tool that measures the curvature of wafers or other deposition substrates. It works in-situ, during production processes, and delivers in real-time the curvature value of the surface investigated. more 


LayTec offers in-line metrology systems that can be integrated into any solar module production line offering 100% coverage for process and quality control. The best example is X Link® - a system for non-destructive and accurate evaluation of the level of EVA or polyolefin cross-linking immediately after lamination of solar modules. ...more