LayTec metrology tools provide access to all key parameters during deposition processes in real time – either in-situ during the process or in-line during substrate transfer between deposition chambers. We help you develop new processes, optimize film quality, enhance production efficiency and reduce costs. Our integrated metrology solutions are available for a steadily growing number of industrial processes and materials.
SEMI materials / compound
SEMI materials / advanced silicon
Amorphous thin films / polycrystalline thin films
Organic thin films
Other advanced materials