Make an appointment with LayTec booth personnel at the following events by contacting info@laytec.de

Events

dateeventplace
16. Apr 2018 -
18. Mar 2018
apc|m Europe
Talk: End point detection for wet etching process by optical in-situ metrology
Dresden, Germany
22. Apr 2018 -
25. Apr 2018
ICULTA
Booth
Talk: Application of deep UV-LEDs for metrology and process control in semiconductor industry
Berlin, Germany
28. May 2018 -
30. May 2018
SNEC
Booth: E3-550 (JSUN)
Shanghai, China
03. Jun 2018 -
08. Jun 2018
ICMOVPE-19
Booth: 1-2
Talk: Metrology for MOCVD processes – latest progress for enabling high-yield VCSEL manufacturing
Nara, Japan

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