LayTec - integrated metrology for advanced processes

LayTec offers integrated optical metrology for thin-film deposition and other high value generating processes. This website is designed for our customers and partners from various industries as well as for related research organizations.

Benefits of integrated metrology

  • Quick identification and correction of process deviations
  • Optimization of thin-film quality
  • Enhancement of production efficiency and yield
  • Fast transfer of established processes to new lines
  • Fast track to new materials and processes

News

OEM partnership with Evatec Ltd. - a leading supplier of thin film deposition systems

50 nm thin layers monitored with astonishing precision by SolR®

Further news