In-situ metrology for electronics: RF, power, logic & memory
The electronics market spans a broad area of specialized devices produced with different thin-film technolgies. LayTec in-situ systems have proven indispensable for optimizing material quality and obtaining run-to-run reproducibility. LayTec tools offer real-time access to key parameters of growth processes for electronic applications: strain, growth homogeneity, temperature variations and many more. Tight in-situ monitoring during the deposition / etch process will help to enhance your yield, optimize your device processes and achieve the best device performance and uniformity.