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LayTec – integrated metrology for advanced processes

News

  • In-situ monitoring of 2D materials epitaxy during chemical vapor deposition
  • Data Sheet EpiX C2C
  • Optimizing epitaxial layer uniformity by combining in-situ and ex-situ metrology
  • Discontinuation of NI PCIe 6025 software support
  • LayTec to supply two InspiRe systems for in-situ monitoring of perovskite formation to Helmholtz Innovation Lab HySPRINT at Helmholtz-Zentrum Berlin
  • In-line thickness monitoring during R2R OLED and OPV manufacturing

Benefits of integrated metrology

  • Quick identification of process deviations
  • Optimization of thin-film quality
  • Enhancement of production efficiency and yield
  • Fast transfer of established processes
  • Fast track to new materials and processes

Meet LayTec at...

  • MRS Spring Meeting & Exhibit
  • CS International 2023
  • Further Events

 
Solutions
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