Mapping station for sheet resistance & optical transparency

EddyCus^® TF map Hybrid

The challenge in the development and production of transparent conductive films is achieving the best possible "compromise" in: Low sheet resistance High optical transmission Low costs per m2

The sheet resistance and the optical transmission / optical density must meet specific levels depending on the application. Additionally, the homogeneity in resistance and transmission, the absence of local defects and in some specific films also isotropic or anisotropic resistances are of interest. Together with our partner SURAGUS GmbH, we offer the non-contact eddy current EddyCus® TF map Hybrid  that allows simultaneous mapping measurement of sheet resistance [Ohm/sq], optical transmission [%], absorptance and optical density at a fixed wavelength. Here is one example of the sheet resistance mapping:

Fig. 2: Sheet resistance mapping of etched FTO on glass substrate showing inhomogeneities (bright areas) in the thin FTO layer

Highlights:

• Contact-free & real-time
• Fast simultaneous measurement of sheet resistance and optical transmission
• Layer thickness mapping of metal films
• Mapping of encapsulated and sensitive layers
• Various software-assisted analysis options
• Easy to handle software

Benefits:

• High usability
• Quick automated mapping in real-time
• User-friendly statistical analysis

The measurements by EddyCus® TF map Hybrid are based on the method of Eddy Current Sensing ...more
To find out how the tool can save your costs, please contact mail@laytec.de.

LayTec AG  |  Seesener Str. 10-13  |  10709 Berlin, Germany  |  Tel.: +49 (0)30 89 00 55-0   |  Fax: +49 (0)30 89 00 55-180  |  Email: info@laytec.de | LinkedIn