LayTec’s expertise lies not only in metrology. Our software and design engineers, physicists, chemists and process engineers combine expert knowledge on metrology with expert knowledge on process optimization. As a result, LayTec can always serve the industries and R&D communities with solutions drawing from a combination of several key technologies:
- Advanced real-time metrology methods ... more
- Software tools for Advanced Process Control (APC), Fault Detection and Classification (FDC) and related root-cause analysis based on in-situ and in-line metrology data ... more
- Thin film analysis algorithms that correlate in-situ and in-line measured data with material science, final device parameters and process yield.