SolR^® is an in-line monitoring system for PV thin-film applications which provides the key parameters of each layer during the process:

• multiple-thickness line scans of critical layer (absorber, buffer, TCO) without extra handling steps
• monitoring of effective broad band absorption
• conductivity fingerprints
• roughness and texture

SolR^® is currently available for CIGS and CdTe based thin-film solar cells and is compatible with typical in-line and roll-to-roll processes.

For further details see the SolR^® datasheet, SolR^® general brochure and related application notes.