EpiCurve TT for concentrator solar cells
EpiCurveŽTT is applied in MOCVD systems growing multi-junction III-V solar cells on Ge, Si and GaAs substrates. It monitors:
- layer thickness
- temperature
- surface strain
- composition
In collaboration with the Fraunhofer Institute for Solar Energy Systems (ISE), Germany, a research project has been launched to further improve the in-situ monitoring of MOVPE processes for triple-junction photovoltaic cells. The cooperation is aimed at developing monitoring sensors for industrial-scale manufacturing of triple-junction solar cells with improved process control in multi-wafer MOVPE reactors.
EpiCurveŽTT helps to better understand the reasons for dislocations and strain within the layers, to compensate for strain-induced temperature inhomogeneities, to determine the thickness of individual thin layers and to monitor the composition of critical heterojunctions.
For further details see the EpiCurveŽTT datasheet.