After several years of success in the field of compound semiconductors, in 2007 we started to direct our expertise to thin-film photovoltaic applications. Our  in-situ and in-line technology is based on such measurement techniques as reflectometry, emissivity-corrected pyrometry, curvature measurements and reflectance anisotropy spectroscopy. A profound experience in monitoring the key parameters of photovoltaic thin-film structures already during development process has now been integrated into new products for the photovoltaic market.

LayTec photovoltaic metrology systems provide enhanced control to thin-film photovoltaic producers in their on-line processes – enhancing yield and cell efficiency. Additionally, they accelerate development cycles and help to transfer and ramp up established processes to new lines.