Following the growing demand from the market LayTec now offers a new EpiTT version offering three simultaneous reflectance measurements: the EpiTT 3W. [more]
During our successful participation at the EU PVSEC 2011 in Hamburg we presented EddY, the novel device for high resolution sheet resistance measurements powered by Suragus. The new system offers contact-free real-time monitoring of deposition processes of thin-films, e.g. transparent conductive oxides using high speed eddy current measurement. It provides comprehensive conductivity/sheet [more]
Updates contained in the “Microsoft Patch Day” package from June 14th 2011 might interfere with applications from the EpiNet and EpiSense software solutions.
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