The LayTec SolR^® in-line monitoring system provides information on:

• the film thickness of all layers thoughout the thin-film process: transparent conducting oxide (TCO), absorber and buffer layers
• conductivity qualities of the TCO layer material
• the optical band-gap of the absorber material
• the texture and surface roughness

General information - brochure SolR^®

Datasheet SolR^®