In-line metrology solutions for your thin-film production line!

CIGS, CdTe and α-Si based thin-film solar cells production processes

With its product-line SolR^®, LayTec provides an outstanding in-line monitoring system commercially available for the production of thin film solar cells. SolR^® is capable of monitoring the film thickness of all layers throughout the process: transparent conducting oxide (TCO), absorber and buffer layers. SolR^® is available in various editions for copper indium gallium selenide (CIGS), CdTe and α-Si based thin-film solar cells production processes.

• layer uniformity control
• film thickness measurement
• TCO conductivity fingerprint
• glass & TCO haze measurement
• photo- & electroluminescence

 General information - brochure SolR^®

 

PearL – spectroscopic in-line photoluminescence of solar cell materials

LayTec has developed a new in-line monitoring system that is capable of measuring the spectroscopic photoluminescence of layers throughout the solar cell manufacturing process. In contrast to integrating imaging technologies the spectroscopic approach reveals detailed information about the recombination mechanism involved. Observing photoluminescence gives direct access to the band gap and to the composition of binary and multinary compounds.